What does the Delta T Probe do? contact us


The DELTA-T Probe is specifically designed to answer the two questions that determine Embedded Systems compliance. It will:


(1) verify the presence of time and date
information within an embedded system, and

(2) capture the relevant code to allow the method of time
and date comparison being used by the system to be examined.



The DELTA-T Probe overcomes the problem of getting at code and time/date information by directly attaching to chips that hold the relevant information. Specialised test clips (see right) are used to attach to one or more of the system's memory (RAM), code (ROM) and Real Time Clock (RTC) chips.

The RAM is scanned for clock information, and the presence of time and date is visually confirmed to the probe operator. This provides the answer to question (1).

The DELTA-T Probe captures the program code data from the ROM chip as it is being read by the microprocessor to answer question (2). The probe uses access signals to the Real Time Clock chip or the clock information address in RAM as a 'trigger' to freeze the captured code information and isolate the correct section of code.


Who Operates the Delta-T Probe

Delta-T Probe Field service personnel with an elementary understanding of what Embedded Systems are and do. This includes, but is by no means limited to, electrical engineers, facilities managers, and maintenance engineers. The software supplied with the DELTA-T Probe makes locating and identifying different types of ICs easy, by providing a smart search facility complete with pictures and instructions on how to connect the clips. Some elementary training is required, but the hardware and software have been designed to minimise the time required for deployment.


Where can the Delta-T Probe be used?

It is designed for testing older types of embedded system technology, both in-situ 'in the field' and on a test-bench. The components are portable, and come equipped with four hours of battery back up in case a commercial electricity supply is not available at the site of testing.

Details of how to test embedded systems are provided in the Instruction Manual, in the Embedded Systems Testing Strategy section.


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